CHAPTER 1
OVERVIEW OF ELECTRONIC
COMPONENT RELIABILITY
D. David Dylis
IIT Research Institute (IITRI)
CHAPTER 2
OVERVIEW OF ELECTRONIC
SYSTEMS RELIABILITY
Perry L. Martin
National Technical Systems (NTS)
Noshirwan K. Medora
Exponent
CHAPTER 3
PRODUCT LIABILITY
Ian Le May
Metallurgical Consulting Services Ltd.
Part
2
Electronic Failure Analysis
Techniques
CHAPTER 4
PHOTOGRAPHY AND OPTICAL
MICROSCOPY
Lawrence L. Ludwig, Jr.
Electronic Section, Failure Analysis and Physical Testing Branch,
Materials Science Division, Logistics Operations Directorate,
National Aeronautics and Space Administration
CHAPTER 5
X-RAY/RADIOGRAPHIC
COMPONENT INSPECTION
Lawrence L. Ludwig, Jr.
Electronic Section, Failure Analysis and Physical Testing Branch,
Materials Science Division, Logistics Operations Directorate,
National Aeronautics and Space Administration
CHAPTER 6
INFRARED THERMOGRAPHY
Herbert Kaplan
Honeyhill Technical Company
CHAPTER 7
ACOUSTIC MICRO IMAGING
FAILURE ANALYSIS OF
ELECTRONIC DEVICES
L.W. Kessler
J.E. Semmens
Sonoscan, Inc.
CHAPTER 8
METALLOGRAPHY
David J. Roche
HI-REL Laboratories
CHAPTER 9
CHEMICAL CHARACTERIZATION
Perry Martin
National Technical Systems (NTS)
CHAPTER 10
ELECTRONIC AND ELECTRICAL
CHARACTERIZATION
J.J. Erickson
Hughes Space and Communications Company
CHAPTER 11
SCANNING ELECTRON
MICROSCOPY AND X-RAY
ANALYSIS
John R. Devaney
HI-REL Laboratories
CHAPTER 12
MISCELLANEOUS TECHNIQUES
Dennis H. Van Westerhuyzen
Raytheon System Company, Component and Materials Laboratory
Part
3
Electronic Failure Analysis for
Specific Technologies
CHAPTER 13
SOLDER JOINTS
L.G. Vettraino
Electronic Failure Analysis Laboratory
National Technical Systems (NTS)
CHAPTER 14
FAILURE ANALYSIS OF PRINTED
WIRING ASSEMBLIES
Richard A. Blanchard
Exponent
Donald Galler
Department of Materials Science and Engineering
Massachusetts Institute of Technology
Duncan Glover
Alexander Kusko
John D. Loud
Noshirwan K. Medora
Gregory J. Mimmack
Exponent
CHAPTER 15
WIRES AND CABLES
George Slenski
Air Force Wright Laboratory
Wright-Patterson Air Force Base
Donald Galler
Department of Materials Science and Engineering
Massachusetts Institute of Technology
CHAPTER 16
SWITCHES AND RELAYS
Perry Martin
National Technical Systems (NTS)
Richard Blanchard
Exponent
William Denson
IIT Research Institute (IITRI)
Duncan Glover
Exponent
Alexander Kusko
Exponent
Donald Galler
Department of Materials Science and Engineering
Massachusetts Institute of Technology
CHAPTER 17
CONNECTION TECHNOLOGY
Noshirwan K. Medora
Exponent
CHAPTER 18
FAILURE ANALYSIS OF
COMPONENTS
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